With the rapid growth in semiconductor content in today’s vehicles, IC designers need to improve their process of meeting functional safety requirements defined by the ISO 26262 standard. The ISO ...
SE: Why is applying functional test content so challenging today? Ruiz: There are a couple of different factors that make successfully applying functional patterns on the tester a challenge. In fact, ...
As devices become faster and more complex, more board developers are turning to background debugging and JTAG emulators. Anyone involved in the design, manufacture, or repair of processor-driven ...
Generically, embedded test implies a test capability that has been integrated into a product. Of course, whether that product is an IC, a PCB, or a complete system, embedded test means different ...
The evolutionary path of semiconductor ATE (automated test equipment) seemed clear at Semicon West, held July 13–15 in San Francisco. Gone are the expensive, big-iron functional testers of yesterday, ...
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