A new research review looks at how computer vision and machine learning could be used to spot defects in 3D printed concrete.

Researchers have published research detailing their development of an AI framework to detect defects in additively ...

Researchers have tested eight stand-alone deep learning methods for PV cell fault detection and have found that their accuracy was as high as 73%. All methods were trained and tested on the ELPV ...

A new wafer inspection platform combines AI analytics, sub-micron imaging, SWIR sensing, and precision metrology to help ...

OSHIMA CO., LTD., founded in 1971 and headquartered in Taipei with manufacturing bases in Taiwan, Zhejiang, and Guangzhou, is a manufacturer of AI fabric inspection machines and ISO/CE certified ...

Whether the discussion is about smart manufacturing or digital transformation, one of the biggest conversations in the semiconductor industry today centers on the tremendous amount of data fabs ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

Within the context of semiconductor inspection and failure analysis, latent defects present a significant challenge because they make it difficult to determine whether a fault originated during ...

A recent spike in battery-related fires has highlighted the difficulty of spotting flaws in their production. Rarely visible to the naked eye, these flaws can lead to serious battery malfunctions. The ...